Highest Range of IR Test Voltage – Choose from 6.5KVDC or 11KVDC maximum output
High speed output control with Dual Coldfire microprocessors and Dual DSPs to provide dwell times as low as 100ms
High Resistance Measurement Range Transfer measurement up to 150 Teraohms
Expansive Test Sequency Memory holds up to 100 tests with up to 254 steps per test. Tests can be selected via front panel, Ethernet, RS232 or with optional GPIB.
Multi-Dwell Functionality permits dwells at different voltage levels without having to return to zero between test steps – dramatically simplifying advanced analysis of dielectric properties
Ethernet, RS232, Digital I/O & Scanner Control All standard interfaces – Provides the highest level of test automation. GPIB available
Safety Tested per EN 61010-1. EMC compliant to EN 61326-1
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