Keithley Dmm7512 Mfr Dmm7512

Product Highlights

The DMM7512 combines two full-function, high accuracy, high sampling speed DMMs into a 1U high, full rack wide form factor chassis. The compact chassis saves rack space in high-instrument density test systems without compromising measurement performance. Each DMM has identical functionality, and they are entirely independent of each other.Two exact DMM7510s built into one compact enclosure

• Sample complex waveforms with the 1Msample/s, 18-bit digitizer; store up to 27.5 million readings
• Test components used in low power circuits with 0.1µΩ and 1 pA sensitivities
• Maximize test quality with high test uncertainty ratios using 1-year accuracy DC volts as good as 14 ppm
• Built-in Test Script Processor (TSP) enables test sequence execution without controller interaction, reducing test time and communication overhead, while availing the controller for other tasks

Double Test System Density

• Combine sourcing and measurement with the 2606B High Density, 4-channel Source Measure Unit (SMU) and the DMM7512 for four channels of sourcing and two channels of measurement in as little as 2U of rack space
• No extra spacing for thermal management is required between either DMM7512s or 2606Bs

Significantly Reduce Test Time

• Control up to 32 instruments in a TSP-Link test system
• Synchronize measurements with a latency under 500 ns
• Eliminate time-consuming communications between the instruments and a PC
• DMM7512 TSP code is compatible with DMM7510 TSP code

Determine Power Consumption

• Capture current and voltage waveforms with up to 1 Msample/s, 18-bit digitizing
• Synchronize waveform capture using TSP-Link with less than 500 ns latency between initiation of waveform sampling
• Measure low sleep mode current with 1pA DCI sensitivity or 0.1nA current digitization sensitivity

Increase throughput with multidevice testing

• 1U rack height with no spacing between instruments required
• Two DMMs per instrument
• Control multiple instruments with a test script and TSP-Link to reduce bus communication time and save test time