Description

Product Highlights

  • Highest Range of IR Test Voltage – Choose from 6.5KVDC or 11KVDC maximum output
  • High speed output control with Dual Coldfire microprocessors and Dual DSPs to provide dwell times as low as 100ms
  • High Resistance Measurement Range Transfer measurement up to 150 Teraohms
  • Expansive Test Sequency Memory holds up to 100 tests with up to 254 steps per test. Tests can be selected via front panel, Ethernet, RS232 or with optional GPIB.
  • Multi-Dwell Functionality permits dwells at different voltage levels without having to return to zero between test steps – dramatically simplifying advanced analysis of dielectric properties
  • Ethernet, RS232, Digital I/O & Scanner Control All standard interfaces – Provides the highest level of test automation. GPIB available
  • Safety Tested per EN 61010-1. EMC compliant to EN 61326-1

Each Unit Includes

  • TL-980 Test Lead Set
  • NIST traceable Calibration Certificate
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